On the effects of test compaction on defect coverage

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1996, Pages 430-435

  Reddy, Sudhakar M ^a   Pomeranz, Irith ^a   Kajihara, Seiji ^a  

^a UNIVERSITY OF IOWA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ERROR DETECTION; FAILURE ANALYSIS; MATHEMATICAL MODELS; OPTIMIZATION; PROBABILITY; VECTORS;

DEFECT COVERAGE; INPUT VECTORS; NON FEEDBACK BRIDGING FAULTS; SINGLE STUCK AT FAULT; SURROGATE FAULTS; TEST COMPACTION; TEST GENERATION PROCEDURES;

INTEGRATED CIRCUIT TESTING;

EID: 0029709722     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (15)