Scaling of SEU mapping and cross section, and proton induced seu at reduced supply voltage

IEEE Transactions on Nuclear Science

Volumn 46, Issue 6 PART 1, 1999, Pages 1342-1353

  Barak, J ^a   Levinson, J ^a   Akkerman, ^a   Adler, E ^a   Zentner, A ^a   David, D ^a   Lifshitz, Y ^a  

^a SOREQ NUCLEAR RESEARCH CENTER   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON; CMOS INTEGRATED CIRCUITS; ELECTRIC POTENTIAL; IONIZATION; IONS; PHOTODIODES; RANDOM ACCESS STORAGE;

CROSS SECTION; SINGLE EVENT UPSET; SURFACE BARRIER DETECTOR SPECTRA;

PROTONS;

EID: 0033311546     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.819092     Document Type: Article

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