Possible role for secondary particles in proton-induced single event upsets of modern devices

IEEE Transactions on Nuclear Science

Volumn 45, Issue 6 PART 1, 1998, Pages 2745-2751

  Savage, M W ^a   McNulty, P J ^a   Roth, D R ^b   Foster, C C ^b  

^a CLEMSON UNIVERSITY   (United States)

^b JOHNS HOPKINS UNIVERSITY APPLIED PHYSICS LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROELECTRONICS; NEUTRON IRRADIATION; PROTON IRRADIATION; SPACECRAFT EQUIPMENT;

SINGLE EVENT UPSETS (SEU);

RADIATION DAMAGE;

EID: 0032313625     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.736523     Document Type: Article

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