Monitoring SEU Parameters at Reduced Bias

IEEE Transactions on Nuclear Science

Volumn 40, Issue 6, 1993, Pages 1721-1724

  Roth, D R ^a   McNulty, P J ^a   Abdel Kader, W G ^a   Strauss, L ^a   Stassinopoulos, E G ^b  

^a CLEMSON UNIVERSITY   (United States)

^b NASA GODDARD SPACE FLIGHT CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; IONS; MONITORING; NEUTRONS; PROTONS; RADIATION EFFECTS; RADIATION HARDENING; RANDOM ACCESS STORAGE; SENSITIVITY ANALYSIS;

BIAS; CMOS SRAM; SEU SENSITIVITY; SINGLE EVENT UPSET PARAMETERS;

INTEGRATED CIRCUIT TESTING;

EID: 0027841916     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/23.273487     Document Type: Article

References (8)

1. P.J. McNulty, “Predicting SEU Phenomena in Space”, in 1990 IEEE Short Course: Microelectronics for the Natural Radiation Environments of Space (IEEE Nuclear and Radiation Effects Committee, 1990).
2. R.A. Reed, P.J. McNulty, W.J. Beauvais, and D.R. Roth, “Charge Collection Spectroscopy” this conference.
3. P.J. McNulty, W.J. Beauvais, R.A. Reed, D.R. Roth, E.G. Stassinopoulos, and E.G. Brucker, “Charge Collection at Large Angles of Incidence”, IEEE Trans. Nucl. Sci. NS-39, 1622–1629 (1992)
4. P.J. McNulty, W.J. Beauvais, and D.R. Roth, “Determination of SEU Parameters of NMOS and CMOS SRAMS,” IEEE Trans. Nucl. Sci. NS-38, 1463–1470 (1991)
5. W.J. Beauvais, P.J. McNulty, W.G. Abdel-Kader, and R.A. Reed, “SEU Parameters and Proton-Induced Upsets”, to be presented at the RADECS Conference.
6. P.J. McNulty, D.R. Roth, W.J. Beauvais, W.G. Abdel-Kader, and D.C. Dinge, “Comparison of the Charge Collecting Properties of the Junctions and the SEU Response of Microelectronic Circuits” Int. J. Radiat. Instrum., Part D, Nucl. Tracks Radiat. Meas., 19, Nos. 1–4, 929–938 (1991).
7. E.L. Petersen, J.B. Langworthy, and S.E.Diehl, “Suggested Single Event Upset Figure of Merit”, IEEE Trans. Nucl. Sci. NS-30, 4533–4539 (1983).
8. P.J. McNulty, W.G. Abdel-Kader, W.J. Beauvais, L. Adams, E.J. Daly, and R. Harboe-Sorensen, “Simple Model for proton Induced Latchup”, this conference.