Effect of the angle of incidence on proton induced single events in devices - a critical assessment by modeling

IEEE Transactions on Nuclear Science

Volumn 45, Issue 3 pt 3, 1998, Pages 1617-1623

  Akkerman, A ^a   Barak, J ^a   Levinson, J ^a   Lifshitz, Y ^a  

^a Soreq NRC Applied Physics Division   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; COMPUTER SIMULATION; ELECTRONIC EQUIPMENT; MONTE CARLO METHODS; PROTONS; SPACE APPLICATIONS;

ANGLE OF INCIDENCE; PROTON INDUCED SINGLE EVENT UPSET;

RADIATION EFFECTS;

EID: 0032099330     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.685249     Document Type: Article

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