Modeling the cosmic-ray-induced soft-error rate in integrated circuits: An overview

IBM Journal of Research and Development

Volumn 40, Issue 1, 1996, Pages 77-88

  Srinivasan, G R ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

COSMIC RAYS; ERRORS; INTEGRATED CIRCUITS; MATHEMATICAL MODELS; MONTE CARLO METHODS; RADIATION EFFECTS;

COSMIC RAY INDUCED SOFT ERROR RATE; SINGLE EVENT UPSET; SOFT ERROR MONTE CARLO MODEL; SOFT ERROR RATE;

COMPUTER SIMULATION;

EID: 0029779792     PISSN: 00188646     EISSN: None     Source Type: Journal    
DOI: 10.1147/rd.401.0077     Document Type: Review

References (53)

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