메뉴 건너뛰기




Volumn 44, Issue 6 PART 1, 1997, Pages 2243-2249

Proton upset rate simulation by a monte carlo method : importance of the elastic scattering mechanism

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; COMPUTER SOFTWARE; IONS; MONTE CARLO METHODS; PROTONS; RADIATION EFFECTS;

EID: 0031338738     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.659042     Document Type: Article
Times cited : (21)

References (31)
  • 4
    • 0024887312 scopus 로고    scopus 로고
    • A Model for Proton-Induced SELF
    • 36, no. 6, p. 2281, 1989.
    • T.Bion, J. Bourrieau, A Model for Proton-Induced SELF, IEEE Trans. Nucl. Sei. NS36, no. 6, p. 2281, 1989.
    • IEEE Trans. Nucl. Sei. NS
    • Bourrieau, T.J.1
  • 5
    • 34648865050 scopus 로고    scopus 로고
    • Prediction of the Cross-Section of Proton Upset Using a Monte-Carlo Method
    • 75, internal publication ONERA-CERT, p. 20, 1992.
    • Y. Shimano, Prediction of the Cross-Section of Proton Upset Using a Monte-Carlo Method, CR/COMP/75, internal publication ONERA-CERT, p. 20, 1992.
    • CR/COMP
    • Shimano, Y.1
  • 6
    • 0026382710 scopus 로고    scopus 로고
    • Guidelines for Predicting Single Event Upsets in Neutron Environments
    • 38, no. 6, p. 1500,1991.
    • J.R. Letaw, E. Normand, Guidelines for Predicting Single Event Upsets in Neutron Environments, IEEE Trans. Nucl. Sei. NS38, no. 6, p. 1500,1991.
    • IEEE Trans. Nucl. Sei. NS
    • Letaw, J.R.1    Normand, E.2
  • 10
    • 0342284704 scopus 로고    scopus 로고
    • A Microscopic Model of Energy Deposition in Silicon Slabs Exposed to High Energy Protons
    • vol. 62, p. 414, 1987.
    • N. Azzis, H.H.K. Tang, and G.R. Srinivasan, A Microscopic Model of Energy Deposition in Silicon Slabs Exposed to High Energy Protons, J. Appl. Phys. vol. 62, p. 414, 1987.
    • J. Appl. Phys.
    • Azzis, N.1    Tang, H.H.K.2    Srinivasan, G.R.3
  • 11
    • 0030173120 scopus 로고    scopus 로고
    • A Simple Model for Calculating Proton Induced SEU
    • 43, pp. 979-984,1996.
    • J.Barak & al, A Simple Model for Calculating Proton Induced SEU, IEEE Trans . Nucl. Sei. NS 43, pp. 979-984,1996.
    • IEEE Trans . Nucl. Sei. NS
    • Barak, J.1
  • 12
    • 0019679781 scopus 로고    scopus 로고
    • Soft Errors Due to Protons in the Radiation Belt
    • 28, no. 6, December 1981.
    • E. Petersen, Soft Errors Due to Protons in the Radiation Belt, IEEE Trans. Nucl. Sei. Vol. NS 28, no. 6, December 1981.
    • IEEE Trans. Nucl. Sei. Vol. NS
    • Petersen, E.1
  • 13
    • 0030126279 scopus 로고    scopus 로고
    • Approaches to Proton Single-Event Rate Calculations
    • 43, no. 2, pp. 496-504, 1996.
    • E. Petersen, Approaches to Proton Single-Event Rate Calculations, IEEE Trans. Nucl. Sei. NS43, no. 2, pp. 496-504, 1996.
    • IEEE Trans. Nucl. Sei. NS
    • Petersen, E.1
  • 14
    • 36149026016 scopus 로고    scopus 로고
    • Electrons Scattering and Nuclear Structure
    • vol. 28, p. 214, 1956.
    • R. Hofstader, Electrons Scattering and Nuclear Structure, Rev. Mod. Phys. vol. 28, p. 214, 1956.
    • Rev. Mod. Phys.
    • Hofstader, R.1
  • 17
    • 36149018802 scopus 로고    scopus 로고
    • Statistic and Nuclear Reactions
    • 52, p. 295, 1937.
    • V.F. Weisskopf, Statistic and Nuclear Reactions, Phys. Rev. 52, p. 295, 1937.
    • Phys. Rev.
    • Weisskopf, V.F.1
  • 18
    • 0020269370 scopus 로고    scopus 로고
    • Microdosimetric Aspects of Proton Induced Nuclear Reactions in Thin Layers of Silicon
    • 29, no. 6, p. 2012,1982.
    • G.E. Farrel, P.J. McNulty, Microdosimetric Aspects of Proton Induced Nuclear Reactions in Thin Layers of Silicon, IEEE Trans. Nucl. Sei. NS29, no. 6, p. 2012,1982.
    • IEEE Trans. Nucl. Sei. NS
    • Farrel, G.E.1    McNulty, P.J.2
  • 19
    • 0001664320 scopus 로고    scopus 로고
    • Tables of Reaction and Total Cross Sections for Proton-Nucleus Scattering below IGeV
    • 35, p. 429,1986.
    • W.Bauhoff, Tables of Reaction and Total Cross Sections for Proton-Nucleus Scattering Below IGeV, Atomic Data and Nuclear Data Tables 35, p. 429,1986.
    • Atomic Data and Nuclear Data Tables
    • Bauhoff, W.1
  • 25
    • 0030128577 scopus 로고    scopus 로고
    • Récent Trends in Single Event Effects Ground Testing
    • 43, no.2, April 1996.
    • S. Duzellier, R. Ecoffet, Récent Trends in Single Event Effects Ground Testing, IEEE Trans. Nucl. Sei. NS43, no.2, April 1996.
    • IEEE Trans. Nucl. Sei. NS
    • Duzellier, S.1    Ecoffet, R.2
  • 30
    • 0030126407 scopus 로고    scopus 로고
    • Single Event Effects in Avionics
    • 43, no. 2, p. 461, 1996.
    • E. Normand, Single Event Effects in Avionics, IEEE Trans. Nucl. Sei. NS 43, no. 2, p. 461, 1996.
    • IEEE Trans. Nucl. Sei. NS
    • Normand, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.