Estimation of upset sensitive volume thickness and critical energy using low energy heavy-ion beams

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 1998, Pages 576-583

  Ecoffet, R ^a   Duzellier, S ^a   Barak, J ^a   Levinson, J ^a   Lifshitz, Y ^a   Hass, M ^a   Inguimbert, C ^a   Detcheverry, C ^a  

^a CNES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC RANDOM ACCESS STORAGE; GRAPH THEORY; HEAVY IONS; INTEGRATED CIRCUIT TESTING; ION BEAMS; MATHEMATICAL MODELS; VAN DE GRAAFF ACCELERATORS;

ENERGY DEPOSITION; SENSITIVE VOLUME THICKNESS; SINGLE EVENT UPSET; STATIC RANDOM ACCESS MEMORY;

RADIATION EFFECTS;

EID: 0031636894     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)