Low energy proton induced SEE in memories

IEEE Transactions on Nuclear Science

Volumn 44, Issue 6 PART 1, 1997, Pages 2306-2310

  Duzellier, S ^a,c   Ecoffet, R ^a,b   Falguere D ^b,c   Nuns, T ^a,b   Guibert, L ^b,c   Hajdas, W ^a,b,c   Calvet, M C ^a,b,c   Paul, Toulouse ^a,b,c  

^a ONERA   (France)

^b CNES 18 av ^*

^c PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; ELECTRONIC EQUIPMENT TESTING; PROTONS; RADIATION EFFECTS; SENSITIVITY ANALYSIS;

SINGLE EVENT EFFECTS (SEE);

DATA STORAGE EQUIPMENT;

EID: 0031343577     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/23.659050     Document Type: Article

References (9)

1. E.L. Petersen, Approaches to proton single-event rate calculations, IEEE Trans. Nucl. Sei., vol.43, no.2, p. 496, April 1996.
2. T. Bion, J. Bourrieau, A model for proton-induced SEU, IEEE Trans. Nucl. Sei., vol.36, no.6, p. 2281, December 1989.
3. B. Doucin, T. Carrière, C. Poivey, P. Garnier, J. Beaucour, Y. Patin, Model of Single Event Upsets induced by Space Protons in electronic devices, RADECS proceedings, p. 402, 1995.
4. S. Duzellier, R. Ecoffet, Recent trends in single-event effect ground testing, IEEE Trans. Nucl. Sei., vol.43, no.2, p. 671, April 1996.
5. S. Duzellier, D. Falguère, R. Ecoffet, Heavy Ion/Proton Test Results on High Integrated Memories, IEEE Radiation Effects Data Workshop Record, p.36,1993.
6. R. Ecoffet, M. Labrunée, S. Duzellier, D. Falguère, Heavy ions test results on memories, IEEE Radiation Effects Data Workshop Record, p.27,1992. :
7. R. Ecoffet, S. DuzeUier, D. Falguère, L. Guibert, Low LET cross-section measurements using high energy carbon beam, paper submitted to IEEE Trans. Nucl. Sei. NS44, December 1997.
8. R. Ecoffet, S. Duzellier, J. Barak, J. Levinson, Y. Lifshitz, M. Hass, C. Inguimbert, C. Detcheverry, Determination of Sensitive Volume Thicknesses using Low Energy Heavy Ion Beams, paper submitted to RADECS proceedings, Cannes, France, September, 1997.
9. J. Barak, J. Levinson, A. Akkerman, M. Hass, M. Victoria, A. Zentner, A new approach to the analysis of SEU and SEL data to obtain the sensitive volume thickness, RADECS proceedings, p.321, 1995.