Electron collision cross-section data for plasma modeling

IEEE Transactions on Plasma Science

Volumn 27, Issue 5, 1999, Pages 1225-1240

  Huo, Winifred M ^a   Kim, Yong Ki ^a  

^a NASA AMES RESEARCH CENTER   (United States)

Author keywords

Chemistry; Collision processes; Database reliability; Electrons; Impact ionization; Plasma properties

Indexed keywords

COMPUTER SIMULATION; DATABASE SYSTEMS; DISSOCIATION; ELECTRONS; IMPACT IONIZATION; MATHEMATICAL MODELS; PLASMA COLLISION PROCESSES; PLASMA DENSITY;

ELECTRON COLLISION CROSS SECTIONS;

PLASMA SIMULATION;

EID: 0033204135     PISSN: 00933813     EISSN: None     Source Type: Journal    
DOI: 10.1109/27.799798     Document Type: Article

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