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The Journal of Chemical Physics

Volumn 89, Issue 7, 1988, Pages 4042-4047

Electron impact ionization cross sections of SiF2

(5) Shul, Randy J a Hayes, Todd R a Wetzel, Robert C a Baiocchi, Frank A a Freund, Robert S a

a LUCENT TECHNOLOGIES (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36549096618 PISSN: 00219606 EISSN: None Source Type: Journal
DOI: 10.1063/1.454837 Document Type: Article

Times cited : (57)

References (19)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.