Displacement and strain field measurements from SPM images

NanoScience and Technology

Volumn 0, Issue , 2019, Pages 253-276

  Keller, Juergen ^a   Vogel, Dietmar ^a   Schubert, Andreas ^a   Michel, Bernd ^a  

^a FRAUNHOFER IZM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85073697059     PISSN: 14344904     EISSN: 21977127     Source Type: Book Series    
DOI: 10.1007/978-3-642-35792-3_8     Document Type: Chapter

References (39)

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