Atomic force microscopic study of the micro-cracking of magnetic thin films under tension

Scripta Materialia

Volumn 44, Issue 1, 2001, Pages 37-42

  Bobji, M S ^a   Bhushan, B ^a  

^a Ohio State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; ATOMIC FORCE MICROSCOPY; CRACK PROPAGATION; MAGNETIC THIN FILMS; MICROCRACKING; MICROCRACKS; MORPHOLOGY; NUCLEATION; STRAIN; SURFACE TOPOGRAPHY; TENSILE TESTING;

METAL EVAPORATED TAPES; METALLIC PARTICLE TAPES;

MAGNETIC TAPE;

EID: 0035097390     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6462(00)00557-1     Document Type: Article

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