Improving atomic force microscopy imaging with the adaptation of ultrasonic force microscopy

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4703, Issue , 2002, Pages 105-113

  Druffner, Carl J ^a   Sathish, Shamachary ^a  

^a UNIVERSITY OF DAYTON   (United States)

Author keywords

Atomic Force Microscopy; Laser treated ceramics; Microcracking; Nanometer imaging; Ultrasonic Force Microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CERAMIC MATERIALS; IMAGE ANALYSIS; MICROCRACKING; NANOSTRUCTURED MATERIALS; NONDESTRUCTIVE EXAMINATION;

ULTRASONIC FORCE MICROSCOPY (UFM);

ULTRASONIC IMAGING;

EID: 0036029615     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.469613     Document Type: Conference Paper

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