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Volumn 23, Issue 3, 2000, Pages 447-451
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Effect of bump height on the strain variation during the thermal cycling test of ACA flip-chip joints
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Author keywords
[No Author keywords available]
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Indexed keywords
ADHESIVES;
ANISOTROPY;
CONDUCTIVE MATERIALS;
ELECTRONICS PACKAGING;
FINITE ELEMENT METHOD;
INTERFACES (MATERIALS);
STRAIN;
STRESS ANALYSIS;
THERMAL CYCLING;
ANISOTROPICALLY CONDUCTIVE ADHESIVES (ACA);
FLIP CHIP DEVICES;
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EID: 0034272306
PISSN: 15213331
EISSN: None
Source Type: Journal
DOI: 10.1109/6144.868843 Document Type: Article |
Times cited : (42)
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References (7)
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