Big data and deep data in scanning and electron microscopies: deriving functionality from multidimensional data sets

Advanced Structural and Chemical Imaging

Volumn 1, Issue 1, 2015, Pages

  Belianinov, Alex ^a   Vasudevan, Rama ^a   Strelcov, Evgheni ^a   Steed, Chad ^a   Yang, Sang Mo ^a,b,c   Tselev, Alexander ^a   Jesse, Stephen ^a   Biegalski, Michael ^a   Shipman, Galen ^a,d   Symons, Christopher ^a   Borisevich, Albina ^a   Archibald, Rick ^a   Kalinin, Sergei ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b Institute for Basic Science   (South Korea)

^c Seoul National University   (South Korea)

^d LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

High performance computing; Multivariate statistical analysis; Scanning probe microscopy

Indexed keywords

EID: 85057369479     PISSN: None     EISSN: 21980926     Source Type: Journal    
DOI: 10.1186/s40679-015-0006-6     Document Type: Review

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