Watching domains grow: In-situ studies of polarization switching by combined scanning probe and scanning transmission electron microscopy

Journal of Applied Physics

Volumn 110, Issue 5, 2011, Pages

  Chang, Hyejung ^a   Kalinin, Sergei V ^a   Yang, Seungyeul ^b,c   Yu, Pu ^b,c   Bhattacharya, Saswata ^d   Wu, Ping P ^d   Balke, Nina ^a   Jesse, Stephen ^a   Chen, Long Q ^d   Ramesh, Ramamoorthy ^b,c   Pennycook, Stephen J ^a   Borisevich, Albina Y ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b Lawrence Berkeley National Laboratory   (United States)

^c UNIVERSITY OF CALIFORNIA   (United States)

^d PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOTTOM ELECTRODES; FERROELASTIC DOMAINS; FERROELECTRIC DOMAINS; FIRST-ORDER; IN-SITU; IN-SITU STUDY; LOCAL ELECTRIC FIELD; MESOSCOPICS; MULTIFERROIC MATERIALS; MULTIFERROICS; NUCLEATION AND GROWTH; NUCLEATION SITES; PHASE-FIELD MODELING; POLARIZATION SWITCHING; SCANNING PROBES; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPATIALLY RESOLVED;

CONDUCTIVE FILMS; DOMAIN WALLS; ELECTRIC FIELDS; FERROELECTRIC FILMS; FERROELECTRIC MATERIALS; FERROELECTRICITY; NUCLEATION; SCANNING;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 80052938710     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3623779     Document Type: Conference Paper

References (35)

1. J. F. Scott, Ferroelectric Memories (Springer, New York, 2000).
2. P. Maksymovych, S. Jesse, P. Yu, R. Ramesh, A. P. Baddorf, and S. V. Kalinin, Science, 324 1421 (2009). 10.1126/science.1171200
3. A. N. Kolmogorov, Izv. Akad. Nauk. SSSR Ser. Mat. 1 (3), 355 (1937).
4. M. Avrami, J. Chem. Phys. 8, 212 (1940). 10.1063/1.1750631
5. Y. Ishibash and Y. Takagi, J. Phys. Soc. Jpn. 31, 506 (1971). 10.1143/JPSJ.31.506
6. A. Gruverman, B. J. Rodriguez, C. Dehoff, J. D. Waldrep, A. I. Kingon, R. J. Nemanich, and J. S. Cross, Appl. Phys. Lett. 87, 3 (2005). 10.1063/1.2010605
7. Y. W. So, D. J. Kim, T. W. Noh, J. G. Yoon, and T. K. Song, Appl. Phys. Lett. 86, 3 (2005). 10.1063/1.1870126
8. J. Y. Jo, S. M. Yang, T. H. Kim, H. N. Lee, J. G. Yoon, S. Park, Y. Jo, M. H. Jung, and T. W. Noh, Phys. Rev. Lett. 102, 4 (2009). 10.1103/PhysRevLett. 102.045701
9. A. Grigoriev, R. Sichel, H. N. Lee, E. C. Landahl, B. Adams, E. M. Dufresne, and P. G. Evans, Phys. Rev. Lett. 100, 4 (2008). 10.1103/PhysRevLett. 100.027604
10. R. Nath, Y. H. Chu, N. A. Polomoff, R. Ramesh, and B. D. Huey, Appl. Phys. Lett. 93, 3 (2008). 10.1063/1.2969045
11. N. A. Polomoff, R. N. Premnath, J. L. Bosse, and B. D. Huey, J. Mater. Sci. 44, 5189 (2009). 10.1007/s10853-009-3699-x
12. S. V. Kalinin, B. J. Rodriguez, S. Jesse, Y. H. Chu, T. Zhao, R. Ramesh, S. Choudhury, L. Q. Chen, E. A. Eliseev, and A. N. Morozovska, Proc. Natl. Acad. Sci. U. S. A. 104, 20204 (2007). 10.1073/pnas.0709316104
13. W. L. Wang and H. Y. Lu, J. Am. Ceram. Soc. 89, 281 (2006). 10.1111/j.1551-2916.2005.00673.x
14. X. B. Chen, Y. Ding, J. S. Liu, C. J. Lu, J. S. Zhu, Y. N. Wang, Ferroelectrics 251, 69 (2001). 10.1080/00150190108008502
15. C. W. Tai, S. H. Choy, and H. L. W. Chan, J. Am. Ceram. Soc. 91, 3335 (2008). 10.1111/j.1551-2916.2008.02592.x
16. V. Dorcet, G. Trolliard, and P. Boullay, Chem. Mat. 20, 5061 (2008). 10.1021/cm8004634
17. G. Trolliard and V. Dorcet, Chem. Mat. 20, 5074 (2008). 10.1021/cm800464d
18. X. Tan and J. K. Shang, J. Appl. Phys. 96, 2805 (2004). 10.1063/1.1775307
19. W. Qu, X. Zhao, and X. Tan, J. Appl. Phys. 102, 084101 (2007). 10.1063/1.2795677
20. X. L. Tan, H. He, and J. K. Shang, J. Mater. Res. 20, 1641 (2005). 10.1557/JMR.2005.0213
21. S. Y. Yang, F. Zavaliche, L. Mohaddes-Ardabili, V. Vaithyanathan, D. G. Schlom, Y. J. Lee, Y. H. Chu, M. P. Cruz, Q. Zhan, T. Zhao, and R. Ramesh, Appl. Phys. Lett. 87, 3 (2005). 10.1063/1.2041830
22. K. van Benthem and S. J. Pennycook, in Dekker Encyclopedia of Nanoscience and Nanotechnology, edited by, J. A. Schwartz, C. I. Contescu, and, K. Putyera, (Taylor and Francis, London, 2008), Vol. 2, p. 1217.
23. S. K. Streiffer, C. B. Parker, A. E. Romanov, M. J. Lefevre, L. Zhao, J. S. Speck, W. Pompe, C. M. Foster, and G. R. Bai, J. Appl. Phys. 83, 2742 (1998);
24. A. E. Romanov, M. J. Lefevre, J. S. Speck, W. Pompe, S. K. Streiffer, and C. M. Foster, J. Appl. Phys. 83, 2754 (1998). 10.1063/1.366632
25. See supplementary material at http://dx.doi.org/10.1063/1.3623779 E-JAPIAU-110-012192 for additional details of imaging, modeling, and data interpretation as well as the full movie.
26. A. Agronin, Y. Rosenwaks, and G. Rosenman, Appl. Phys. Lett. 85, 452 (2004). 10.1063/1.1772858
27. B. J. Rodriguez, R. J. Nemanich, A. Kingon, A. Gruverman, S. V. Kalinin, K. Terabe, X. Y. Liu, and K. Kitamura, Appl. Phys. Lett. 86, 012906 (2005). 10.1063/1.1845594
28. S. Jesse, H. N. Lee, and S. V. Kalinin, Rev. Sci. Instrum. 77, 073702 (2006). 10.1063/1.2214699
29. X. Y. Liu, K. Terabe, and K. Kitamura, Phys. Scr., T 129, 103 (2007). 10.1088/0031-8949/2007/T129/023
30. H. J. Chang, In situ studies of ferroelectric switching by STM/(S)TEM in thin films with conducting bottom electrode (to be published).
31. A. Lubk, S. Gemming, and N. A. Spaldin, Phys. Rev. B 80, 10 (2009). 10.1103/PhysRevB.80.104110
32. S. Choudhury, J. X. Zhang, Y. L. Li, L. Q. Chen, Q. X. Jia, and S. V. Kalinin, Appl. Phys. Lett. 93, 3 (2008). 10.1063/1.2993330
33. V. V. Kharton, Solid State Electrochemistry I: Fundamentals, Materials and their Applications (Wiley-VCH, Berlin, 2009).
34. C. L. Jia, V. Nagarajan, J. Q. He, L. Houben, T. Zhao, R. Ramesh, K. Urban, and R. Waser, Nat. Mater. 6, 64 (2007). 10.1038/nmat1808
35. A. Y. Borisevich, H. J. Chang, M. Huijben, M. P. Oxley, S. Okamoto, M. K. Niranjan, J. D. Burton, E. Y. Tsymbal, Y. H. Chu, P. Yu, R. Ramesh, S. V. Kalinin, and S. J. Pennycook, Phys. Rev. Lett. 105, 087204 (2010). 10.1103/PhysRevLett.105.087204