Deep data analysis of conductive phenomena on complex oxide interfaces: Physics from data mining

ACS Nano

Volumn 8, Issue 6, 2014, Pages 6449-6457

  Strelcov, Evgheni ^a   Belianinov, Alexei ^a   Hsieh, Ying Hui ^b   Jesse, Stephen ^a   Baddorf, Arthur P ^a   Chu, Ying Hao ^b,c   Kalinin, Sergei V ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^c INSTITUTE OF PHYSICS   (Taiwan)

Author keywords

big data; conduction hysteresis; FORC IV; multivariate analysis; oxide heterostructures; scanning probe microscopy

Indexed keywords

BISMUTH COMPOUNDS; ELECTRON EMISSION; GRAIN BOUNDARIES; HYSTERESIS; SCANNING PROBE MICROSCOPY;

DATA-DRIVEN APPROACH; FIRST-ORDER REVERSAL CURVES; FORC-IV; MULTI VARIATE ANALYSIS; MULTIVARIATE STATISTICAL ANALYSIS; OXIDE HETEROSTRUCTURES; PHYSICAL INTERPRETATION; SPATIALLY INHOMOGENEOUS SYSTEMS;

BIG DATA;

EID: 84903478903     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn502029b     Document Type: Article

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