Artificial intelligence and pattern recognition techniques in microscope image processing and analysis

Advances in Imaging and Electron Physics

Volumn 114, Issue C, 2000, Pages 1-77

  Bonnet, Noël ^a,b  

^a INSERM   (France)

^b LERI (University of Reims)   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 23044520937     PISSN: 10765670     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S1076-5670(00)80020-8     Document Type: Article

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