Mapping bias-induced phase stability and random fields in relaxor ferroelectrics

Applied Physics Letters

Volumn 95, Issue 9, 2009, Pages

  Rodriguez, B J ^a   Jesse, S ^b   Bokov, A A ^c   Ye, Z G ^c   Kalinin, S V ^b  

^a UNIVERSITY COLLEGE DUBLIN   (Ireland)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c SIMON FRASER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

MESOSCOPICS; NANOSCALE DOMAIN; PIEZORESPONSE FORCE MICROSCOPY; POLARIZATION REVERSALS; RANDOM FIELDS; RELAXOR FERROELECTRIC; RELAXORS; SPATIAL FLUCTUATION; SPATIAL VARIABILITY; ZERO BIAS;

FERROELECTRIC MATERIALS; LEAD; NIOBIUM; POLARIZATION;

PHASE STABILITY;

EID: 69949132038     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3222868     Document Type: Article

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