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Volumn 6, Issue , 2015, Pages

Complete information acquisition in dynamic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; EIGENVALUE; INFORMATION MANAGEMENT; NANOTECHNOLOGY; PARAMETERIZATION; PIXEL; TIMESCALE;

EID: 84924872546     PISSN: None     EISSN: 20411723     Source Type: Journal    
DOI: 10.1038/ncomms7550     Document Type: Article
Times cited : (52)

References (22)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.