Effect of doping on surface reactivity and conduction mechanism in samarium-doped ceria thin films

ACS Nano

Volumn 8, Issue 12, 2014, Pages 12494-12501

  Yang, Nan ^a,b   Belianinov, Alex ^d   Strelcov, Evgheni ^d   Tebano, Antonello ^a   Foglietti, Vittorio ^c   Di Castro, Daniele ^a   Schlueter, Christoph ^e   Lee, Tien Lin ^e   Baddorf, Arthur P ^d   Balke, Nina ^d   Jesse, Stephen ^d   Kalinin, Sergei V ^d   Balestrino, Giuseppe ^a   Aruta, Carmela ^a  

^a UNIVERSITY OF ROME TOR VERGATA   (Italy)

^b NICCOLÒ CUSANO UNIVERSITY   (Italy)

^c CNR   (Italy)

^d OAK RIDGE NATIONAL LABORATORY   (United States)

^e DIAMOND LIGHT SOURCE LTD   (United Kingdom)

Author keywords

hard X ray photoemission; ion conduction; scanning probe microscopy; Sm doped ceria

Indexed keywords

ACTIVATION ENERGY; CERIUM OXIDE; HYSTERESIS; PHOTOELECTRON SPECTROSCOPY; SAMARIUM; SCANNING PROBE MICROSCOPY; SEMICONDUCTOR DOPING;

DOPED CERIA; ELECTRICAL CONDUCTION MECHANISMS; ELECTROCHEMICAL STRAIN MICROSCOPIES; FIRST-ORDER REVERSAL CURVES; HARD X-RAY PHOTOEMISSION; HARD X-RAY PHOTOEMISSION SPECTROSCOPY; ION CONDUCTION; SCANNING PROBE MEASUREMENTS;

X RAYS;

EID: 84919754358     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn505345c     Document Type: Article

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