SCOPUS 정보 검색 플랫폼

Energy and Environmental Science

Volumn 10, Issue 2, 2017, Pages 570-579

Junction behavior of n-Si photoanodes protected by thin Ni elucidated from dual working electrode photoelectrochemistry

(4) Laskowski, Forrest A L a Nellist, Michael R a Venkatkarthick, Radhakrishnan a,b Boettcher, Shannon W a

a UNIVERSITY OF OREGON (United States)

b CENTRAL ELECTROCHEMICAL RESEARCH INSTITUTE (India)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMOBILE DRIVERS; CATALYSTS; ELECTROCHEMISTRY; ELECTRODES; ELECTRONIC PROPERTIES; METAL INSULATOR BOUNDARIES; MIS DEVICES; NICKEL; SEMICONDUCTOR JUNCTIONS; SILICA;

ELECTROCHEMICAL CYCLING; METAL-INSULATOR-SEMICONDUCTORS; PHOTO-ELECTROCHEMISTRY; PHOTOANODE MATERIALS; PHOTOELECTROCHEMICAL WATER SPLITTING; PHOTOELECTROCHEMICALS; SOLUTION INTERFACE; SPATIALLY INHOMOGENEOUS;

SILICON;

CATALYST; EFFICIENCY MEASUREMENT; ELECTROCHEMISTRY; ELECTRODE; ELECTRONIC EQUIPMENT; HYPOTHESIS TESTING; PERFORMANCE ASSESSMENT; REACTION KINETICS;

EID: 85025100465 PISSN: 17545692 EISSN: 17545706 Source Type: Journal
DOI: 10.1039/c6ee03505a Document Type: Article

Times cited : (97)

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- De Vecchi, S.¹ Desrues, T.² Souche, F.³ Muñoz, D.⁴ Ribeyron, P.J.⁵ Lemiti, M.⁶

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.