Differentiating Ferroelectric and Nonferroelectric Electromechanical Effects with Scanning Probe Microscopy

ACS Nano

Volumn 9, Issue 6, 2015, Pages 6484-6492

  Balke, Nina ^a,b   Maksymovych, Petro ^a,b   Jesse, Stephen ^a,b   Herklotz, Andreas ^c   Tselev, Alexander ^a,b   Eom, Chang Beom ^d   Kravchenko, Ivan I ^a   Yu, Pu ^e,f,g   Kalinin, Sergei V ^a,b  

^a Center for Nanophase Materials Sciences   (United States)

^b Institute for Functional Imaging of Materials   (United States)

^c OAK RIDGE NATIONAL LABORATORY   (United States)

^d Wisconsin Electric Machines and Power Electronics Consortium   (United States)

^e TSINGHUA UNIVERSITY   (China)

^f Collaborative Innovation Center of Quantum Matter ^*  (China)

^g RIKEN Center for Emergent Matter Science   (Japan)

Author keywords

electrostatics; ferroelectricity; relaxors; scanning probe microscopy

Indexed keywords

ELECTROSTATICS; FERROELECTRICITY; FUNCTIONAL MATERIALS; HYDROPHOBICITY; SCANNING PROBE MICROSCOPY;

ELECTRO-MECHANICAL HYSTERESIS; ELECTROMECHANICAL EFFECTS; INORGANIC OXIDES; MEASUREMENT CHARACTERISTICS; MEASUREMENT PROTOCOL; MODERN SCIENCE; PIEZORESPONSE FORCE MICROSCOPY; RELAXORS;

FERROELECTRIC MATERIALS;

EID: 84934959359     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/acsnano.5b02227     Document Type: Article

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