Probing surface and bulk electrochemical processes on the LaAlO 3-SrTiO 3 interface

ACS Nano

Volumn 6, Issue 5, 2012, Pages 3841-3852

  Kumar, Amit ^a   Arruda, Thomas M ^a   Kim, Yunseok ^a   Ivanov, Ilia N ^a   Jesse, Stephen ^a   Bark, Chung W ^b   Bristowe, Nicholas C ^c   Artacho, Emilio ^c,d,e   Littlewood, Peter B ^c,f   Eom, Chang Beom ^b   Kalinin, Sergei V ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF WISCONSIN MADISON   (United States)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^d DONOSTIA INTERNATIONAL PHYSICS CENTER DIPC   (Spain)

^e BASQUE FOUNDATION FOR SCIENCE   (Spain)

^f ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Charge writing; Dynamic strain; Electrochemical; Microscopy

Indexed keywords

CHARGE WRITING; DYNAMIC STRAIN; ELECTROCHEMICAL; ELECTROCHEMICAL COMPONENTS; ELECTROCHEMICAL PHENOMENA; ELECTROCHEMICAL PROCESS; ELECTROCHEMICAL STRAIN; HIGH-VOLTAGES; KELVIN PROBE FORCE MICROSCOPY; LOW-VOLTAGE; SRTIO; SURFACE ADSORBATES; SURFACE DEFORMATION;

MICROSCOPIC EXAMINATION; STRONTIUM TITANATES;

LANTHANUM ALLOYS;

EID: 84864686046     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn204960c     Document Type: Article

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