Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO3 thin films on DyScO3 substrates

Applied Physics Letters

Volumn 102, Issue 8, 2013, Pages

  Lee, Che Hui ^a,b   Skoromets, Volodymyr ^c   Biegalski, Michael D ^d   Lei, Shiming ^b   Haislmaier, Ryan ^b   Bernhagen, Margitta ^e   Uecker, Reinhard ^e   Xi, Xiaoxing ^f   Gopalan, Venkatraman ^b   Martí, Xavier ^c,g   Kamba, Stanislav ^c   Kužel, Petr ^c   Schlom, Darrell G ^a  

^a Cornell University   (United States)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

^c INSTITUTE OF PHYSICS   (Czech Republic)

^d OAK RIDGE NATIONAL LABORATORY   (United States)

^e LEIBNIZ INSTITUTE FOR CRYSTAL GROWTH   (Germany)

^f Temple University   (United States)

^g CHARLES UNIVERSITY   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT DIPOLES; DIELECTRIC SPECTRA; MEASUREMENTS OF; NON-STOICHIOMETRIC; NON-STOICHIOMETRY; RELAXOR BEHAVIOR; STOICHIOMETRIC FILMS; TEMPERATURE DEPENDENT;

EPITAXIAL GROWTH; NONLINEAR OPTICS; PERMITTIVITY; STOICHIOMETRY; STRONTIUM TITANATES;

EPITAXIAL FILMS;

EID: 84874829334     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4793649     Document Type: Article

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