Ni-(In,Ga)As alloy formation investigated by hard-X-ray photoelectron spectroscopy and X-ray absorption spectroscopy

Physical Review Applied

Volumn 2, Issue 6, 2014, Pages

  Walsh, Lee A ^a,b,c   Hughes, Greg ^a,b,c   Weiland, Conan ^a,b,c   Woicik, Joseph C ^a,b,c   Lee, Rinus T P ^a,b,c   Loh, Wei Yip ^a,b,c   Lysaght, Pat ^a,b,c   Hobbs, Chris ^a,b,c  

^a DUBLIN CITY UNIVERSITY   (Ireland)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^c SEMATECH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY ALLOYS; CHEMICAL ANALYSIS; CHEMICAL SPECIATION; GALLIUM COMPOUNDS; INDIUM ALLOYS; NICKEL; PHASE SEPARATION; PHOTOELECTRONS; PHOTONS; SEMICONDUCTOR ALLOYS; X RAY ABSORPTION SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY; X RAYS;

ANNEAL TEMPERATURES; COMPOSITIONAL MODELING; HARD X-RAY PHOTOELECTRON SPECTROSCOPY; SAMPLE STRUCTURE; STEADY DIFFUSION; STRUCTURAL INTERACTIONS; THERMAL-ANNEALING; TRANSISTOR STRUCTURE;

GALLIUM ALLOYS;

EID: 84930504322     PISSN: None     EISSN: 23317019     Source Type: Journal    
DOI: 10.1103/PhysRevApplied.2.064010     Document Type: Article

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