XAFS and X-ray reflectivity study of III-V compound native oxide/GaAs interfaces

Journal of Synchrotron Radiation

Volumn 8, Issue 2, 2001, Pages 824-826

  Cheong, Seong Kyun ^a   Bunker, Bruce A ^a   Hall, D C ^a   Snider, G L ^a   Barrios, P J ^a  

^a NONE

Author keywords

Arsenic oxide; EXAFS; Gallium Arsenide; Gallium oxide; Reflection mode XAFS; Reflectivity; XANES

Indexed keywords

ARTICLE;

EID: 0035294623     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049501001248     Document Type: Article

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