Modelling the inelastic scattering of fast electrons

Ultramicroscopy

Volumn 151, Issue , 2015, Pages 11-22

  Allen, L J ^a   D'Alfonso, A J ^a   Findlay, S D ^b  

^a UNIVERSITY OF MELBOURNE   (Australia)

^b MONASH UNIVERSITY   (Australia)

Author keywords

Atomic resolution imaging; Inelastic scattering of fast electrons; Mixed dynamic form factor

Indexed keywords

APPROXIMATION THEORY; ELECTRONS; IMAGE RECONSTRUCTION; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC RESOLUTION; ATOMIC-RESOLUTION IMAGING; CONVENTIONAL TRANSMISSION ELECTRON MICROSCOPIES; FAST ELECTRONS; FORM FACTORS; IMAGING MODES; NUMERICAL IMPLEMENTATION;

INELASTIC SCATTERING;

ARTICLE; ELECTRON TRANSPORT; IMAGE ANALYSIS; IMAGING SOFTWARE; INELASTIC SCATTERING OF FAST ELECTRON; MATHEMATICAL ANALYSIS; PROCESS MODEL; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84924857730     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2014.10.011     Document Type: Article

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