Coherence in electron energy loss spectrometry

Journal of Electron Spectroscopy and Related Phenomena

Volumn 143, Issue 2-3 SPEC. ISS., 2005, Pages 81-95

  Schattschneider, P ^a,b   Werner, W S M ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b CNRS   (France)

Author keywords

Coherence; EELS; Energy loss spectrometry; Inelastic electron scattering

Indexed keywords

DENSITY MATRIX; ENERGY LOSS SPECTROMETRY; INELASTIC COHERENCE; INELASTIC ELECTRON SCATTERING;

COHERENT LIGHT; CRYSTALS; DENSITY (SPECIFIC GRAVITY); ELASTIC MODULI; ELECTRON SCATTERING; ELECTRON TRANSITIONS; ERROR ANALYSIS; INTERFEROMETERS; MAGNETIC MOMENTS; MICROANALYSIS; PHASE SHIFT; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 14544292417     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2004.09.029     Document Type: Article

References (72)

1. H. Kohl, and H. Rose Adv. Electron. Electron Phys. 65 1985 173
2. Y. Kainuma Acta Crystallogr. 8 1955 247
3. J. Gjønnes Acta Crystallogr. 20 1966 240
4. P. Rez, C.J. Humphreys, and M.J. Whelan Phil. Mag. 35 1977 81
5. F.N. Chukhovskii, L.A. Alexanjan, and Z.G. Pinsker Acta Crystallogr. A 29 1973 38
6. L.J. Allen Ultramicroscopy 48 1993 97
7. S.L. Dudarev, L.M. Peng, and M.J. Whelan Phys. Rev. B 48 1993 13408
8. P. Schattschneider, M. Nelhiebel, and B. Jouffrey Phys. Rev. B 59 1999 10959
9. S. Takagi J. Phys. Soc. Jpn. 13 2 1958 278
10. S. Takagi J. Phys. Soc. Jpn. 13 1958 287
11. C. Rossouw Ultramicroscopy 16 2 1985 241
12. Z. Wang Elastic and Inelastic Scattering in Electron Diffraction and Imaging 1995 Plenum Press New York
13. C. Rossouw, and M. Whelan Ultramicroscopy 6 1981 53
14. W. Coene, and D. van Dyke Ultramicroscopy 33 1990 261
15. A. Weickenmeier, and H. Kohl Phil. Mag. B 60 1989 467
16. R. Howie Proc. Roy. Soc. A 271 1963 268
17. J. Tafto, and O. Krivanek Nucl. Instrum. Meth. 194 1982 153
18. J. Tafto, and J. Spence Ultramicroscopy 9 1982 243
19. J. Spence, and J. Tafto J. Microsc. 130 Pt 2 1983 147
20. M. Oxley, and L. Allen Phys. Rev. B 57 1998 3273
21. C. Rossouw Ultramicroscopy 72 1998 17
22. P. Schattschneider Fundamentals of Inelastic Electron Scattering 1986 Springer-Verlag Wien
23. Y. Kainuma Acta Crystallogr. 8 1955 247
24. P.A. Stadelmann Ultramicroscopy 21 1987 131
25. L. Reimer Transmission Electron Microscopy, Springer Series in Optical Sciences 2nd ed. 1989 Springer-Verlag Berlin
26. P. Schattschneider, M. Nelhiebel, H. Souchay, and B. Jouffrey Micron 31 2000 333
27. L.D. Landau Z. Phys. 45 1927 430
28. Y. Kagan, Y.V. Kononets, Kurtchatov Institute of Atomic Energy Report, 1972, p. 211.
29. A. Wright, and D. Bird Acta Crystallogr. 1989 342
30. S. Dudarev, P. Rez, and M. Whelan Phys. Rev. B 51 1995 3397
31. P. Stallknecht, and H. Kohl Ultramicroscopy 66 1996 261
32. H. Muller, A coherence function approach to image simulation, Ph.D. Thesis, Technical University Darmstadt, 2000.
33. P.M. Echenique, J. Bausells, and A. Rivacoba Phys. Rev. B 35 1987 1521
34. B. Freitag, and W. Mader J. Microsc. 1999 42
35. M. Schenner, M. Nelhiebel, and P. Schattschneider Ultramicroscopy 65 1996 95
36. P. Schattschneider, M. Nelhiebel, M. Schenner, W. Grogger, and F. Hofer J. Microsc. 183 1996 18
37. J. Spence, and J. Tafto J. Microsc. 130 1983 147
38. O. Krivanek, M. Disko, J. Tafto, and J. Spence Ultramicroscopy 9 1982 249
39. J. Auerhammer, and P. Rez Phys. Rev. B 40 1989 2024
40. M. Nelhiebel, N. Luchier, P. Schorsch, P. Schattschneider, and B. Jouffrey Phil. Mag. B 79 1999
41. C. Souche, P.-H. Louf, P. Blaha, M. Nelhiebel, J. Luitz, P. Schattschneider, K. Schwarz, and B. Jouffrey Ultramicroscopy 83 2000 9
42. P. Blaha, K. Schwarz and J. Luitz, WIEN97, Vienna University of Technology 1997 (Updated Unix version of: P. Blaha, K. Schwarz, P. Sorantin, S.B. Trickey, Comput. Phys. Commun. 59 (1990) 399).
43. P. Blaha, K. Schwarz and J. Luitz, WIEN97, Vienna University of Technology 1997 (Updated Unix version of: P. Blaha, K. Schwarz, P. Sorantin, S.B. Trickey, Comput. Phys. Commun. 59 (1990) 399).
44. M. Nelhiebel, N. Luchier, P. Schorsch, P. Schattschneider, and B. Jouffrey Phil. Mag. B 79 1999 941
45. P. Schattschneider, C. Hébert, and B. Jouffrey Ultramicroscopy 86 2001 343
46. R. Currat, P. DeCicco, and R. Weiss Phys. Rev. B 14 1971 4256
47. A. Compton Phys. Rev. 1923 483
48. B. Williams, T. Sparrow, and R. Egerton Proc. Roy. Soc. London 1984 409
49. A.J. Bourdillon, and C. Cha Phil. Mag. Lett. 74 1996 113
50. A. Exner, H. Kohl, P. Schattschneider, and P. Jonas J. Phys.: Condens. Matter 6 1994 3443
51. A. Exner, H. Kohl, M. Nelhiebel, and P. Schattschneider J. Phys.: Condens. Matter 8 1996 2835
52. P. Schattschneider, and B. Jouffrey Eur. Phys. J. B 37 2004 3
53. A. Harscher, H. Lichte, and J. Mayer Ultramicroscopy 69 1997 201
54. H. Lichte, and B. Freitag Ultramicroscopy 81 2000 177
55. H. Lichte, P. Potapov, D. van Dyck, and P. Schattschneider Microscopy and Microanalysis vol. 9, suppl. 3 2003 Cambridge University Press p. 084
56. P.W. Hawkes Optik 50 1978 353
57. R.F. Egerton Electron Energy-Loss Spectroscopy in the Electron Microscope 2nd ed. 1996 Plenum Press New York
58. A. Desalvo, A. Parisini, and R. Rosa J. Phys. D 1984 2455
59. G. Faraci, and A. Pennisi Lett. Nuovo Cim. 1984 40
60. K. Srivastava, S. Singh, P. Gupta, and O. Harsh J. Electron. Spectrosc. Relat. Phenom. 1982 211
61. J. Ashley, and R. Ritchie Phys. Stat. Sol. 1970 425
62. J.M. Pitarke, and R.H. Ritchie Nucl. Instrum. Meth. B 94 1994 358
63. I. Campillo, and J.M. Pitarke Nucl. Instrum. Meth. B 115 1996 75
64. J. Spence, and A. Spargo Phys. Rev. Lett. 1971 895
65. P. Schattschneider, F. Foedermayr, and D.-S. Su Phys. Rev. Lett. 59 1987 724
66. A.P. Hitchcock Jpn. J. Appl. Phys. 32 suppl. 2 1992 176
67. J.C. Fuggle J.E. Inglesfield Unoccupied Electronic States 1992 Springer Berlin
68. C. Hebert, and P. Schattschneider Ultramicroscopy 96 2003 463
69. M. Nelhiebel, P. Schattschneider, and B. Jouffrey Phys. Rev. Lett. 85 2000 1847
70. S. Rubino, C. Hébert, and P. Schattschneider Proceedings of the Microscopy Conference Dresden, September 7-12 2003 (Late Breaking Poster)
71. P. Schattschneider, E. Carlino, H. Lichte, P. Novak, J. Zweck, C. Hebert, J. Bernardi, in: Proceedings of the 13th European Microscopy Congress, Antwerp, Belgium, August 2004, IM11.02, IM11.02.
72. P. Schattschneider, and W.S.M. Werner J. Elect. Spectrosc. Relat. Phenom. 143 2005 81