Is there a Stobbs factor in atomic-resolution STEM-EELS mapping?

Ultramicroscopy

Volumn 139, Issue , 2014, Pages 38-46

  Xin, Huolin L ^a,c   Dwyer, Christian ^b,d   Muller, David A ^a  

^a School of Operations Research and Industrial Engineering   (United States)

^b MONASH UNIVERSITY   (Australia)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

^d Ernst Ruska Centre for Microscopy and Spectroscopy with Electrons   (Germany)

Author keywords

Atomic resolution STEM EELS; Delocalization; Double channeling; Inelastic scattering; Stobbs factor

Indexed keywords

ATOMIC RESOLUTION STEM-EELS; DELOCALIZATION; DOUBLE CHANNELING; INELASTIC SCATTERING; STOBBS FACTOR;

MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING TRANSMISSION;

EID: 84894103140     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2014.01.006     Document Type: Article

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