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Physical Review Letters

Volumn 112, Issue 8, 2014, Pages

Quantitative elemental mapping at atomic resolution using X-ray spectroscopy

(7) Kothleitner, G a,b Neish, M J c Lugg, N R c Findlay, S D d Grogger, W a,b Hofer, F a,b Allen, L J c

a GRAZ UNIVERSITY OF TECHNOLOGY (Austria)

b Graz Centre for Electron Microscopy (Austria)

c UNIVERSITY OF MELBOURNE (Australia)

d MONASH UNIVERSITY (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ELEMENTAL CONCENTRATIONS; ENERGY DISPERSIVE X-RAY; ENERGY DISPERSIVE X-RAY SPECTROSCOPY; QUANTITATIVE COMPARISON; QUANTUM-MECHANICAL CALCULATION; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SUB-MICRON RESOLUTIONS; WELL-ESTABLISHED TECHNIQUES;

ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY DISPERSIVE SPECTROSCOPY; SCATTERING; TRANSMISSION ELECTRON MICROSCOPY;

ATOMS;

EID: 84897713969 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.112.085501 Document Type: Article

Times cited : (103)

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