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Applied Physics Letters

Volumn 103, Issue 14, 2013, Pages

Towards artifact-free atomic-resolution elemental mapping with electron energy-loss spectroscopy

(5) Zhu, Y a Soukiassian, A b Schlom, D G b Muller, D A b Dwyer, C a,c

a MONASH UNIVERSITY (Australia)

b School of Operations Research and Industrial Engineering (United States)

c FORSCHUNGSZENTRUM JÜLICH (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; BARIUM TITANATE; ELASTIC SCATTERING; ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ENERGY DISSIPATION; STRONTIUM TITANATES; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC RESOLUTION; ELASTIC CONTRAST; ELEMENTAL MAPPING; ENERGY-LOSS SPECTROSCOPY; PLASMON EXCITATIONS; ROBUST APPROACHES; SCANNING TRANSMISSION ELECTRON MICROSCOPES; VISUAL INTERPRETATION;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 84885572031 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4823704 Document Type: Article

Times cited : (12)

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