Analysis of nonlinear intensity attenuation in bright-field TEM images for correct 3D reconstruction of the density in micron-sized materials

Microscopy

Volumn 63, Issue 5, 2014, Pages 345-355

  Yamasaki, Jun ^a,b   Mutoh, Michihiro ^b   Ohta, Shigemasa ^c   Yuasa, Syuichi ^c   Arai, Shigeo ^b   Sasaki, Katsuhiro ^b   Tanaka, Nobuo ^b  

^a OSAKA UNIVERSITY   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

^c JEOL LTD   (Japan)

Author keywords

360 tilt sample holder; Bright field TEM; Carbon microcoil; Electron tomography; HVEM; Nonlinear intensity attenuation

Indexed keywords

CARBON; ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTRONS; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; REPAIR;

360°-TILT SAMPLE HOLDER; BRIGHT FIELD TRANSMISSION ELECTRON MICROSCOPY; BRIGHT-FIELD TEM; BRIGHT-FIELDS; CARBON MICROCOIL; ELECTRON TOMOGRAPHY; HVEM; NONLINEAR INTENSITY ATTENUATION; SAMPLE HOLDERS; TOMOGRAPHIC RECONSTRUCTION;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 84924756530     PISSN: 20505698     EISSN: 20505701     Source Type: Journal    
DOI: 10.1093/jmicro/dfu020     Document Type: Article

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