메뉴 건너뛰기




Volumn 62, Issue 5, 2013, Pages 521-531

Lorentzian-like image blur of gold nanoparticles on thick amorphous silicon films in ultra-high-voltage transmission electron microscopy

Author keywords

blur function; contrast; transmission; ultra high voltage transmission electron microscope

Indexed keywords

AMORPHOUS FILMS; AMORPHOUS SILICON; FIBER OPTIC SENSORS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INELASTIC SCATTERING; METAL NANOPARTICLES; METALLIC FILMS;

EID: 84885945676     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dft031     Document Type: Article
Times cited : (11)

References (24)
  • 1
    • 0342953002 scopus 로고
    • Some applications of an ultra-high voltage electron microscope on materials science
    • Fujita H, Tabata T, Yoshida K, Sumida N, and Katagiri S (1972) Some applications of an ultra-high voltage electron microscope on materials science. Jpn. J. Appl. Phys. 11: 1522-1536
    • (1972) Jpn. J. Appl. Phys , vol.11 , pp. 1522-1536
    • Fujita, H.1    Tabata, T.2    Yoshida, K.3    Sumida, N.4    Katagiri, S.5
  • 2
    • 80052070229 scopus 로고    scopus 로고
    • Topics in recent studies with high-voltage electron microscopes
    • Mori H (2011) Topics in recent studies with high-voltage electron microscopes. J. Electron Microsc. 60: S189-S197
    • (2011) J. Electron Microsc , vol.60
    • Mori, H.1
  • 3
    • 0033053359 scopus 로고    scopus 로고
    • High-voltage electron tomography of spindle pole bodies and early mitotic spindles in the yeast Saccharomyces cerevisiae
    • O'toole E T, Winey M, and Mcintosh J R (1999) High-voltage electron tomography of spindle pole bodies and early mitotic spindles in the yeast Saccharomyces cerevisiae. Mol. Biol. Cell 10: 2017-2031
    • (1999) Mol. Biol. Cell , vol.10 , pp. 2017-2031
    • O'toole, E.T.1    Winey, M.2    Mcintosh, J.R.3
  • 4
    • 0033864643 scopus 로고    scopus 로고
    • Correlated 3D light and electron microscopy: Use of high voltage electron microscopy and electron tomography for imaging large biological structures
    • Martone M E, Deerinck T J, Yamada N, Bushong E, and Ellisman M H (2000) Correlated 3D light and electron microscopy: Use of high voltage electron microscopy and electron tomography for imaging large biological structures. J. Histotechnol. 23: 261-270
    • (2000) J. Histotechnol , vol.23 , pp. 261-270
    • Martone, M.E.1    Deerinck, T.J.2    Yamada, N.3    Bushong, E.4    Ellisman, M.H.5
  • 6
    • 38349097382 scopus 로고    scopus 로고
    • Microscopic tomography with ultra-HVEM and applications
    • Takaoka A, Hasegawa T, Yoshida K, and Mori H (2008) Microscopic tomography with ultra-HVEM and applications. Ultramicroscopy 108: 230-238
    • (2008) Ultramicroscopy , vol.108 , pp. 230-238
    • Takaoka, A.1    Hasegawa, T.2    Yoshida, K.3    Mori, H.4
  • 7
    • 36149063790 scopus 로고
    • Le microscope électronique 1•5 MV
    • Dupouy G (1969) Le microscope électronique 1•5 MV. J. Phys. D: Appl. Phys. 2: 769-774
    • (1969) J. Phys. D: Appl. Phys , vol.2 , pp. 769-774
    • Dupouy, G.1
  • 9
    • 0031417565 scopus 로고    scopus 로고
    • Development of a new 3 MV ultra-high voltage electron microscope at Osaka University
    • Takaoka A, Ura K, Mori H, Katsuta T, Matsui I, and Hayashi S (1997) Development of a new 3 MV ultra-high voltage electron microscope at Osaka University. J. Electron Microsc. 46: 447-456
    • (1997) J. Electron Microsc , vol.46 , pp. 447-456
    • Takaoka, A.1    Ura, K.2    Mori, H.3    Katsuta, T.4    Matsui, I.5    Hayashi, S.6
  • 11
    • 0000278004 scopus 로고
    • Effect of inelastic waves on electron diffraction
    • Yoshioka H (1957) Effect of inelastic waves on electron diffraction. J. Phys. Soc. Jpn. 12: 618-628
    • (1957) J. Phys. Soc. Jpn , vol.12 , pp. 618-628
    • Yoshioka, H.1
  • 12
    • 84996258119 scopus 로고
    • The optimum voltage in very high voltage electron microscopy
    • Humphreys C J (1971) The optimum voltage in very high voltage electron microscopy. Philos. Mag. 25: 1459-1472
    • (1971) Philos. Mag , vol.25 , pp. 1459-1472
    • Humphreys, C.J.1
  • 14
    • 11844305068 scopus 로고    scopus 로고
    • New views of cells in 3D: An introduction to electron tomography
    • Mcintosh R, Nicastro D, and Mastronarde D (2005) New views of cells in 3D: An introduction to electron tomography. Trends Cell Biol. 15: 43-51
    • (2005) Trends Cell Biol , vol.15 , pp. 43-51
    • Mcintosh, R.1    Nicastro, D.2    Mastronarde, D.3
  • 15
    • 33745204649 scopus 로고    scopus 로고
    • Three-dimensional imaging of nanovoids in copper interconnects using incoherent bright field tomography
    • Ercius P, Weyland M, Muller D A, and Gignac L M (2006) Three-dimensional imaging of nanovoids in copper interconnects using incoherent bright field tomography. Appl. Phys. Lett. 88: 243116-243113
    • (2006) Appl. Phys. Lett , vol.88 , pp. 243116-243113
    • Ercius, P.1    Weyland, M.2    Muller, D.A.3    Gignac, L.M.4
  • 16
    • 35348818724 scopus 로고    scopus 로고
    • Measurement of electron transmission through tilted thick specimens with an ultrahigh voltage electron microscope
    • Zhang H-B, Wang F, and Takaoka A (2007) Measurement of electron transmission through tilted thick specimens with an ultrahigh voltage electron microscope. J. Electron Microsc. 56: 51-55
    • (2007) J. Electron Microsc , vol.56 , pp. 51-55
    • Zhang, H.-B.1    Wang, F.2    Takaoka, A.3
  • 17
    • 0036413524 scopus 로고    scopus 로고
    • Limits of specimen thickness for energy-filtered tomography of stained plastic sections at 120 kV beam voltage
    • Kocsis E, Weisberg A, Moss B, Chen X, Reese T S, and Leapman R D (2002) Limits of specimen thickness for energy-filtered tomography of stained plastic sections at 120 kV beam voltage. Microsc. Microanal. 8: 882-883
    • (2002) Microsc. Microanal , vol.8 , pp. 882-883
    • Kocsis, E.1    Weisberg, A.2    Moss, B.3    Chen, X.4    Reese, T.S.5    Leapman, R.D.6
  • 18
    • 4244136161 scopus 로고
    • Straggling of fast electrons in aluminum foils observed in high-voltage electron microscopy (0.3-1.2 MV
    • Perez J P, Sevely J, and Jouffrey B (1977) Straggling of fast electrons in aluminum foils observed in high-voltage electron microscopy (0.3-1.2 MV). Phys. Rev. A 16: 1061-1069
    • (1977) Phys. Rev , vol.A16 , pp. 1061-1069
    • Perez, J.P.1    Sevely, J.2    Jouffrey, B.3
  • 19
    • 75849148441 scopus 로고    scopus 로고
    • Multiple scattering effects of MeV electrons in very thick amorphous specimens
    • Wang F, Zhang H-B, Cao M, Nishi R, and Takaoka A (2010) Multiple scattering effects of MeV electrons in very thick amorphous specimens. Ultramicroscopy 110: 259-268
    • (2010) Ultramicroscopy , vol.110 , pp. 259-268
    • Wang, F.1    Zhang, H.-B.2    Cao, M.3    Nishi, R.4    Takaoka, A.5
  • 20
    • 77954385772 scopus 로고    scopus 로고
    • Image quality of microns-thick specimens in the ultra-high voltage electron microscope
    • Wang F, Zhang H-B, Cao M, Nishi R, and Takaoka A (2010) Image quality of microns-thick specimens in the ultra-high voltage electron microscope. Micron 41: 490-497
    • (2010) Micron , vol.41 , pp. 490-497
    • Wang, F.1    Zhang, H.-B.2    Cao, M.3    Nishi, R.4    Takaoka, A.5
  • 21
    • 18844452391 scopus 로고
    • Multiple scattering of 5-30 keV electrons in evaporated metal films I Total transmission and angular distribution
    • Cosslett V E and Thomas R N (1964) Multiple scattering of 5-30 keV electrons in evaporated metal films: I. Total transmission and angular distribution. Br. J. Appl. Phys. 15: 883
    • (1964) Br. J. Appl. Phys , vol.15 , pp. 883
    • Cosslett, V.E.1    Thomas, R.N.2
  • 22
    • 0000818830 scopus 로고
    • On the energy loss of fast electrons by ionization
    • Landau L (1944) On the energy loss of fast electrons by ionization. J. Phys. USSR 8: 201
    • (1944) J. Phys. USSR , vol.8 , pp. 201
    • Landau, L.1
  • 23
    • 84885899206 scopus 로고
    • 2nd edn. Scattering and phase contrast for amorphous specimen, Ch. 6, Springer, Berlin
    • Reimer L (1993) Transmission electron microscopy, 2nd edn. Scattering and phase contrast for amorphous specimen, Ch. 6, p. 195 (Springer, Berlin
    • (1993) Transmission Electron Microscopy , pp. 195
    • Reimer, L.1
  • 24
    • 48049105762 scopus 로고    scopus 로고
    • Omega filter installed in the 1 MV microscope of Kyushu University
    • Omoto K, Tsuno K, Ohsaki M, Matsumura S, and Tomokiyo Y (2008) Omega filter installed in the 1 MV microscope of Kyushu University. Micron 39: 666-675
    • (2008) Micron , vol.39 , pp. 666-675
    • Omoto, K.1    Tsuno, K.2    Ohsaki, M.3    Matsumura, S.4    Tomokiyo, Y.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.