-
1
-
-
0342953002
-
Some applications of an ultra-high voltage electron microscope on materials science
-
Fujita H, Tabata T, Yoshida K, Sumida N, and Katagiri S (1972) Some applications of an ultra-high voltage electron microscope on materials science. Jpn. J. Appl. Phys. 11: 1522-1536
-
(1972)
Jpn. J. Appl. Phys
, vol.11
, pp. 1522-1536
-
-
Fujita, H.1
Tabata, T.2
Yoshida, K.3
Sumida, N.4
Katagiri, S.5
-
2
-
-
80052070229
-
Topics in recent studies with high-voltage electron microscopes
-
Mori H (2011) Topics in recent studies with high-voltage electron microscopes. J. Electron Microsc. 60: S189-S197
-
(2011)
J. Electron Microsc
, vol.60
-
-
Mori, H.1
-
3
-
-
0033053359
-
High-voltage electron tomography of spindle pole bodies and early mitotic spindles in the yeast Saccharomyces cerevisiae
-
O'toole E T, Winey M, and Mcintosh J R (1999) High-voltage electron tomography of spindle pole bodies and early mitotic spindles in the yeast Saccharomyces cerevisiae. Mol. Biol. Cell 10: 2017-2031
-
(1999)
Mol. Biol. Cell
, vol.10
, pp. 2017-2031
-
-
O'toole, E.T.1
Winey, M.2
Mcintosh, J.R.3
-
4
-
-
0033864643
-
Correlated 3D light and electron microscopy: Use of high voltage electron microscopy and electron tomography for imaging large biological structures
-
Martone M E, Deerinck T J, Yamada N, Bushong E, and Ellisman M H (2000) Correlated 3D light and electron microscopy: Use of high voltage electron microscopy and electron tomography for imaging large biological structures. J. Histotechnol. 23: 261-270
-
(2000)
J. Histotechnol
, vol.23
, pp. 261-270
-
-
Martone, M.E.1
Deerinck, T.J.2
Yamada, N.3
Bushong, E.4
Ellisman, M.H.5
-
5
-
-
0036417312
-
A cell-centered database for electron tomographic data
-
Martone M E, Gupta A, Wong M, Qian X, Sosinsky G, Ludäscher B, and Ellisman M H (2002) A cell-centered database for electron tomographic data. J. Struct. Biol. 138: 145-155
-
(2002)
J. Struct. Biol
, vol.138
, pp. 145-155
-
-
Martone, M.E.1
Gupta, A.2
Wong, M.3
Qian, X.4
Sosinsky, G.5
Ludäscher, B.6
Ellisman, M.H.7
-
7
-
-
36149063790
-
Le microscope électronique 1•5 MV
-
Dupouy G (1969) Le microscope électronique 1•5 MV. J. Phys. D: Appl. Phys. 2: 769-774
-
(1969)
J. Phys. D: Appl. Phys
, vol.2
, pp. 769-774
-
-
Dupouy, G.1
-
8
-
-
0004547737
-
3 million volt electron microscope
-
Ozasa S, Kato Y, Todokoro H, Kasai S, Katagiri S, Kimura H, Sugata E, Fukai K, Fujita H, and Ura K (1972) 3 million volt electron microscope. J. Electron Microsc. 21: 109-118
-
(1972)
J. Electron Microsc
, vol.21
, pp. 109-118
-
-
Ozasa, S.1
Kato, Y.2
Todokoro, H.3
Kasai, S.4
Katagiri, S.5
Kimura, H.6
Sugata, E.7
Fukai, K.8
Fujita, H.9
Ura, K.10
-
9
-
-
0031417565
-
Development of a new 3 MV ultra-high voltage electron microscope at Osaka University
-
Takaoka A, Ura K, Mori H, Katsuta T, Matsui I, and Hayashi S (1997) Development of a new 3 MV ultra-high voltage electron microscope at Osaka University. J. Electron Microsc. 46: 447-456
-
(1997)
J. Electron Microsc
, vol.46
, pp. 447-456
-
-
Takaoka, A.1
Ura, K.2
Mori, H.3
Katsuta, T.4
Matsui, I.5
Hayashi, S.6
-
11
-
-
0000278004
-
Effect of inelastic waves on electron diffraction
-
Yoshioka H (1957) Effect of inelastic waves on electron diffraction. J. Phys. Soc. Jpn. 12: 618-628
-
(1957)
J. Phys. Soc. Jpn
, vol.12
, pp. 618-628
-
-
Yoshioka, H.1
-
12
-
-
84996258119
-
The optimum voltage in very high voltage electron microscopy
-
Humphreys C J (1971) The optimum voltage in very high voltage electron microscopy. Philos. Mag. 25: 1459-1472
-
(1971)
Philos. Mag
, vol.25
, pp. 1459-1472
-
-
Humphreys, C.J.1
-
13
-
-
0023225313
-
Three-dimensional tomographic reconstruction in high voltage electron microscopy
-
Frank J, Mcewen B F, Radermacher M, Turner J N, and Rieder C L (1987) Three-dimensional tomographic reconstruction in high voltage electron microscopy. J. Electron Microsc. Tech. 6: 193-205
-
(1987)
J. Electron Microsc. Tech
, vol.6
, pp. 193-205
-
-
Frank, J.1
Mcewen, B.F.2
Radermacher, M.3
Turner, J.N.4
Rieder, C.L.5
-
14
-
-
11844305068
-
New views of cells in 3D: An introduction to electron tomography
-
Mcintosh R, Nicastro D, and Mastronarde D (2005) New views of cells in 3D: An introduction to electron tomography. Trends Cell Biol. 15: 43-51
-
(2005)
Trends Cell Biol
, vol.15
, pp. 43-51
-
-
Mcintosh, R.1
Nicastro, D.2
Mastronarde, D.3
-
15
-
-
33745204649
-
Three-dimensional imaging of nanovoids in copper interconnects using incoherent bright field tomography
-
Ercius P, Weyland M, Muller D A, and Gignac L M (2006) Three-dimensional imaging of nanovoids in copper interconnects using incoherent bright field tomography. Appl. Phys. Lett. 88: 243116-243113
-
(2006)
Appl. Phys. Lett
, vol.88
, pp. 243116-243113
-
-
Ercius, P.1
Weyland, M.2
Muller, D.A.3
Gignac, L.M.4
-
16
-
-
35348818724
-
Measurement of electron transmission through tilted thick specimens with an ultrahigh voltage electron microscope
-
Zhang H-B, Wang F, and Takaoka A (2007) Measurement of electron transmission through tilted thick specimens with an ultrahigh voltage electron microscope. J. Electron Microsc. 56: 51-55
-
(2007)
J. Electron Microsc
, vol.56
, pp. 51-55
-
-
Zhang, H.-B.1
Wang, F.2
Takaoka, A.3
-
17
-
-
0036413524
-
Limits of specimen thickness for energy-filtered tomography of stained plastic sections at 120 kV beam voltage
-
Kocsis E, Weisberg A, Moss B, Chen X, Reese T S, and Leapman R D (2002) Limits of specimen thickness for energy-filtered tomography of stained plastic sections at 120 kV beam voltage. Microsc. Microanal. 8: 882-883
-
(2002)
Microsc. Microanal
, vol.8
, pp. 882-883
-
-
Kocsis, E.1
Weisberg, A.2
Moss, B.3
Chen, X.4
Reese, T.S.5
Leapman, R.D.6
-
18
-
-
4244136161
-
Straggling of fast electrons in aluminum foils observed in high-voltage electron microscopy (0.3-1.2 MV
-
Perez J P, Sevely J, and Jouffrey B (1977) Straggling of fast electrons in aluminum foils observed in high-voltage electron microscopy (0.3-1.2 MV). Phys. Rev. A 16: 1061-1069
-
(1977)
Phys. Rev
, vol.A16
, pp. 1061-1069
-
-
Perez, J.P.1
Sevely, J.2
Jouffrey, B.3
-
19
-
-
75849148441
-
Multiple scattering effects of MeV electrons in very thick amorphous specimens
-
Wang F, Zhang H-B, Cao M, Nishi R, and Takaoka A (2010) Multiple scattering effects of MeV electrons in very thick amorphous specimens. Ultramicroscopy 110: 259-268
-
(2010)
Ultramicroscopy
, vol.110
, pp. 259-268
-
-
Wang, F.1
Zhang, H.-B.2
Cao, M.3
Nishi, R.4
Takaoka, A.5
-
20
-
-
77954385772
-
Image quality of microns-thick specimens in the ultra-high voltage electron microscope
-
Wang F, Zhang H-B, Cao M, Nishi R, and Takaoka A (2010) Image quality of microns-thick specimens in the ultra-high voltage electron microscope. Micron 41: 490-497
-
(2010)
Micron
, vol.41
, pp. 490-497
-
-
Wang, F.1
Zhang, H.-B.2
Cao, M.3
Nishi, R.4
Takaoka, A.5
-
21
-
-
18844452391
-
Multiple scattering of 5-30 keV electrons in evaporated metal films I Total transmission and angular distribution
-
Cosslett V E and Thomas R N (1964) Multiple scattering of 5-30 keV electrons in evaporated metal films: I. Total transmission and angular distribution. Br. J. Appl. Phys. 15: 883
-
(1964)
Br. J. Appl. Phys
, vol.15
, pp. 883
-
-
Cosslett, V.E.1
Thomas, R.N.2
-
22
-
-
0000818830
-
On the energy loss of fast electrons by ionization
-
Landau L (1944) On the energy loss of fast electrons by ionization. J. Phys. USSR 8: 201
-
(1944)
J. Phys. USSR
, vol.8
, pp. 201
-
-
Landau, L.1
-
23
-
-
84885899206
-
-
2nd edn. Scattering and phase contrast for amorphous specimen, Ch. 6, Springer, Berlin
-
Reimer L (1993) Transmission electron microscopy, 2nd edn. Scattering and phase contrast for amorphous specimen, Ch. 6, p. 195 (Springer, Berlin
-
(1993)
Transmission Electron Microscopy
, pp. 195
-
-
Reimer, L.1
-
24
-
-
48049105762
-
Omega filter installed in the 1 MV microscope of Kyushu University
-
Omoto K, Tsuno K, Ohsaki M, Matsumura S, and Tomokiyo Y (2008) Omega filter installed in the 1 MV microscope of Kyushu University. Micron 39: 666-675
-
(2008)
Micron
, vol.39
, pp. 666-675
-
-
Omoto, K.1
Tsuno, K.2
Ohsaki, M.3
Matsumura, S.4
Tomokiyo, Y.5
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