High-angle triple-axis specimen holder for three-dimensional diffraction contrast imaging in transmission electron microscopy

Ultramicroscopy

Volumn 111, Issue 8, 2011, Pages 1168-1175

  Hata, S ^a   Miyazaki, H ^b   Miyazaki, S ^c   Mitsuhara, M ^a   Tanaka, M ^a   Kaneko, K ^a   Higashida, K ^a   Ikeda, K ^a   Nakashima, H ^a   Matsumura, S ^a   Barnard, J S ^d   Sharp, J H ^e   Midgley, P A ^d  

^a KYUSHU UNIVERSITY   (Japan)

^b Mel Build   (Japan)

^c Thermo Fisher Scientific   (United States)

^d UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^e University of Cambridge ^*  (United Kingdom)

Author keywords

Diffraction contrast; Dislocation; Electron tomography; Scanning transmission electron microscopy (STEM); Specimen holder

Indexed keywords

ANGULAR RANGE; DIFFRACTION CONTRAST; DISLOCATION ARRANGEMENT; DUAL AXIS; ELECTRON TOMOGRAPHY; EX SITU; HORIZONTAL AXIS; IMAGE CONTRASTS; ORTHOGONAL AXES; SCANNING TRANSMISSION ELECTRON MICROSCOPY (STEM); SPECIMEN HOLDER; THREE-DIMENSIONAL (3-D) RECONSTRUCTION; THREE-DIMENSIONAL DIFFRACTION; TOMOGRAPHIC RECONSTRUCTION;

CRYSTALLINE MATERIALS; DIFFRACTION; ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTRONS; TRANSMISSION ELECTRON MICROSCOPY;

THREE DIMENSIONAL;

ARTICLE; CONTRAST; DEVICE; DIFFRACTION; EQUIPMENT DESIGN; HIGH ANGLE TRIPLE AXIS SPECIMEN HOLDER; IMAGE ANALYSIS; IMAGE RECONSTRUCTION; ROTATION; SCANNING TRANSMISSION ELECTRON MICROSCOPY; THREE DIMENSIONAL IMAGING; TILTING; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 79960019910     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.03.021     Document Type: Article

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