Electron tomography of regularly shaped nanostructures under non-linear image acquisition

Journal of Microscopy

Volumn 232, Issue 1, 2008, Pages 186-195

  Saghi, Z ^a   Xu, X ^a   Mobus G ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

Electron tomography; Geometric tomography; Projection linearity; Simulations; TEM

Indexed keywords

ATOMS; CERIUM OXIDE; ELECTRIC IMPEDANCE TOMOGRAPHY;

ATOMIC NUMBERS; ELECTRON TOMOGRAPHY; GEOMETRIC TOMOGRAPHY; LINEAR IMAGES; MONOTONICS; NON LINEAR; PROJECTION LINEARITY; QUANTITATIVE CHARACTERIZATION; SIMULATION; TEM;

NANOSTRUCTURES;

CERIUM; CERIUM OXIDE; NANOMATERIAL; TUNGSTEN;

ARTICLE; ARTIFACT; COMPUTER SIMULATION; ELECTRON TOMOGRAPHY; IMAGING; PRIORITY JOURNAL; TOMOGRAPHY;

EID: 52649137777     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2008.02084.x     Document Type: Article

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