Development of an environmental high-voltage electron microscope for reaction science

Journal of Electron Microscopy

Volumn 62, Issue 1, 2013, Pages 205-215

  Tanaka, Nobuo ^a   Usukura, Jiro ^a   Kusunoki, Michiko ^a   Saito, Yahachi ^a   Sasaki, Katuhiro ^a   Tanji, Takayoshi ^a   Muto, Shunsuke ^a   Arai, Shigeo ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

3D tomographic observation; Energy filtered images in TEM STEM; Environmental high voltage electron microscope; In situ observation; Reaction science

Indexed keywords

NANOMATERIAL;

CHEMISTRY; ELECTRON; ELECTRON ENERGY LOSS SPECTROSCOPY; EQUIPMENT; EQUIPMENT DESIGN; ISOLATION AND PURIFICATION; METHODOLOGY; REVIEW; SACCHAROMYCES CEREVISIAE; THREE DIMENSIONAL IMAGING; TRANSMISSION ELECTRON MICROSCOPY; ULTRASTRUCTURE;

ELECTRONS; EQUIPMENT DESIGN; IMAGING, THREE-DIMENSIONAL; MICROSCOPY, ELECTRON, TRANSMISSION; NANOSTRUCTURES; SACCHAROMYCES CEREVISIAE; SPECTROSCOPY, ELECTRON ENERGY-LOSS;

ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

3D TOMOGRAPHIC OBSERVATION; ENERGY; ENERGY-FILTERED IMAGE IN TEM/STEM; ENVIRONMENTAL HIGH-VOLTAGE ELECTRON MICROSCOPE; FILTERED IMAGES; HIGH VOLTAGE ELECTRON MICROSCOPE; IN-SITU OBSERVATIONS; REACTION SCIENCE; TEM/STEM; TOMOGRAPHIC;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 84876952432     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfs095     Document Type: Review

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