Measurement of electron transmission through tilted thick specimens with an ultrahigh voltage electron microscope

Journal of Electron Microscopy

Volumn 56, Issue 2, 2007, Pages 51-55

  Zhang, Hai Bo ^a   Wang, Fang ^a   Takaoka, Akio ^b  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

Accelerating voltage; Electron transmission; Measurement; Objective aperture; Specimen thickness; TEM

Indexed keywords

ELECTRON MICROSCOPES; ELECTRON SCATTERING; ELECTRONS;

ACCELERATING VOLTAGES; ATTENUATION RANGE; EFFECTIVE THICKNESS; ELECTRON TRANSMISSION; LINEAR ATTENUATION; MEASUREMENTS OF; OBJECTIVE APERTURE; SPECIMEN THICKNESS; TEM; VOLTAGE ELECTRONS;

EPOXY RESINS;

EID: 35348818724     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfm002     Document Type: Article

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