Image blurring of thick specimens due to MeV transmission electron scattering: A Monte Carlo study

Journal of Electron Microscopy

Volumn 60, Issue 5, 2011, Pages 315-320

  Wang, Fang ^a   Zhang, Hai Bo ^a   Cao, Meng ^a   Nishi, Ryuji ^b   Takaoka, Akio ^b  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

Electron scattering; Image blurring; Monte Carlo simulation; TEM

Indexed keywords

DISSOCIATION; ELASTIC SCATTERING; ELECTRON ENERGY LEVELS; ELECTRONS; EPOXY RESINS; GOLD NANOPARTICLES; INTELLIGENT SYSTEMS; MONTE CARLO METHODS;

ELECTRONS ENERGY; GOLD NANOPARTICLE; GOLD NANOPARTICLES; IMAGE BLURRING; LINE DENSITY; MONTE CARLO'S SIMULATION; SPECIMEN THICKNESS; TEM; TOP SURFACE; TRANSMISSION ELECTRON;

ELECTRON SCATTERING;

EID: 80054716345     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfr054     Document Type: Article

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