Nonvolatile memories: Present and future challenges

Proceedings of 2014 9th International Design and Test Symposium, IDT 2014

Volumn , Issue , 2015, Pages 61-66

  Vatajelu, Elena Ioana ^a   Aziza, Hassen ^b   Zambelli, Cristian ^c  

^a POLITECNICO DI TORINO   (Italy)

^b AIX MARSEILLE UNIVERSITÉ   (France)

^c UNIVERSITY OF FERRARA   (Italy)

Author keywords

Flash Memory; Magnetic RAM; Process Variability; Reliability; Resistive RAM

Indexed keywords

FLASH MEMORY; RELIABILITY; RRAM;

ELECTRONIC DEVICE; EMBEDDED MEMORY TECHNOLOGIES; EMERGING MEMORY TECHNOLOGIES; MAGNETIC RAMS; NON-VOLATILE MEMORY; NON-VOLATILE MEMORY TECHNOLOGY; PROCESS VARIABILITY; RANDOM ACCESS MEMORY;

RANDOM ACCESS STORAGE;

EID: 84924308542     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IDT.2014.7038588     Document Type: Conference Paper

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