A new methodology for two-level random-telegraph-noise identification and statistical analysis

IEEE Electron Device Letters

Volumn 31, Issue 6, 2010, Pages 612-614

  Chimenton, Andrea ^a   Zambelli, Cristian ^a   Olivo, Piero ^a  

^a UNIVERSITY OF FERRARA   (Italy)

Author keywords

Compact modeling; Dtatistical analysis; Markov model; Random telegraph noise (RTN)

Indexed keywords

CHARACTERIZATION TECHNIQUES; COMPACT MODELING; INHERENT NOISE; LARGE POPULATION; MARKOV MODEL; MODEL PARAMETERS; MONTE CARLO; NOISE IDENTIFICATION; RANDOM TELEGRAPH NOISE; RELIABILITY SIMULATION; STATISTICAL ANALYSIS; STATISTICAL VALIDITY; STOCHASTIC BEHAVIOR; TWO-STATE MARKOV CHAINS;

MARKOV PROCESSES; TELEGRAPH;

STOCHASTIC MODELS;

EID: 77953028194     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2010.2046311     Document Type: Article

References (12)

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