Erratic bits classification for efficient repair strategies in automotive embedded flash memories

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2013, Pages

  Zambelli, Cristian ^a   Olivo, Piero ^a   Koebernik, Gert ^b   Ullmann, Rudolf ^b   Bauer, Matthias ^b   Tempel, Georg ^b  

^a UNIVERSITY OF FERRARA   (Italy)

^b INFINEON TECHNOLOGIES AG   (Germany)

Author keywords

automotive; embedded flash memories; erratic bits; reliability; repair

Indexed keywords

AUTOMOTIVE; AUTOMOTIVE ENVIRONMENT; CLASSIFICATION METHODOLOGIES; DYNAMIC CORRECTION; ELECTRONIC COMPONENT; EMBEDDED FLASH MEMORY; ERROR PROBABILITIES; SEMICONDUCTOR MEMORY;

ELECTRONIC EQUIPMENT; FLASH MEMORY; REDUNDANCY; RELIABILITY; SEMICONDUCTOR STORAGE;

REPAIR;

EID: 84880986608     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2013.6531964     Document Type: Conference Paper

References (11)

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