Photoelectron transport in the surface region of solids: Universal analytical formalism for quantitative applications of electron spectroscopies

Journal of Physics D: Applied Physics

Volumn 48, Issue 7, 2015, Pages

  Jablonski, A ^a  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

Author keywords

Effective attenuation length; Elastic and inelastic electron scattering; Information depth; Mean escape depth; Quantitative surface analysis by electron spectroscopies

Indexed keywords

ELECTRON SCATTERING; ELECTRON SPECTROSCOPY; ELECTRON TRANSPORT PROPERTIES; ELECTRONS; INTELLIGENT SYSTEMS; MONTE CARLO METHODS; SOLAR RADIATION; SURFACE ANALYSIS;

EFFECTIVE ATTENUATION LENGTH; ESCAPE DEPTH; INELASTIC ELECTRON SCATTERING; INFORMATION DEPTH; QUANTITATIVE SURFACE ANALYSIS;

SURFACE SCATTERING;

EID: 84922191217     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/48/7/075301     Document Type: Article

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