Role of the emission depth distribution function in quantification of electron spectroscopies

Surface Science

Volumn 586, Issue 1-3, 2005, Pages 115-128

  Jablonski, A ^a  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

Author keywords

Auger electron spectroscopy; Electron solid interactions; Electron solid scattering and transmission inelastic; Gold; Monte Carlo simulations; X ray photoelectron spectroscopy

Indexed keywords

ALGORITHMS; ATTENUATION; AUGER ELECTRON SPECTROSCOPY; CHEMICAL ANALYSIS; COMPUTER SIMULATION; GOLD; MONTE CARLO METHODS; SURFACE PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

ELASTIC COLLISIONS; ELASTIC SCATTERING; ELECTRON-SOLID INTERACTIONS; ELECTRON-SOLID SCATTERING AND TRANSMISSION - INELASTIC;

ELECTRON EMISSION;

EID: 20444468426     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2005.04.056     Document Type: Article

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