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Volumn 432, Issue 3, 1999, Pages 211-227

Escape probability of electrons from solids. Influence of elastic electron scattering

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COMPUTER SIMULATION; ELECTRON DIFFRACTION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRON TRANSPORT PROPERTIES; GOLD; MONTE CARLO METHODS; SILICON; SOLIDS; STATISTICAL MECHANICS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0032666974     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00521-X     Document Type: Article
Times cited : (46)

References (40)
  • 1
    • 0042796183 scopus 로고    scopus 로고
    • Standard E 673, Vol. 3.06 American Society for Testing and Materials, West Conshohocken, PA
    • Standard E 673, in: Annual Book of ASTM Standards Vol. 3.06 American Society for Testing and Materials, West Conshohocken, PA, 1997.
    • (1997) Annual Book of ASTM Standards
  • 3
    • 33847509052 scopus 로고
    • D. Briggs, M.P. Seah (Eds.), Wiley, New York, Chapter 5
    • M.P. Seah, in: D. Briggs, M.P. Seah (Eds.), Practical Surface Analysis, 2nd ed., Wiley, New York, 1990, Chapter 5.
    • (1990) Practical Surface Analysis, 2nd Ed.
    • Seah, M.P.1
  • 25
  • 34
    • 0004124597 scopus 로고    scopus 로고
    • Standard Reference Data Program, Database 64, National Institute of Standards and Technology, Gaithersburg, MD
    • NIST Elastic-Electron-Scattering Cross-Section Database, Standard Reference Data Program, Database 64, National Institute of Standards and Technology, Gaithersburg, MD, 1996.
    • (1996) NIST Elastic-Electron-Scattering Cross-Section Database


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.