Mean escape depth of signal photoelectrons from amorphous and polycrystalline solids

Physical Review B - Condensed Matter and Materials Physics

Volumn 54, Issue 15, 1996, Pages 10927-10937

  Jablonski, A ^a   Tilinin, I ^a   Powell, C ^b  

^a INSTITUTE OF PHYSICAL CHEMISTRY   (Poland)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001391458     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.54.10927     Document Type: Article

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