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Volumn 26, Issue 2, 2010, Pages 155-164

Determination of surface composition by X-ray photoelectron spectroscopy taking into account elastic photoelectron collisions

Author keywords

[No Author keywords available]

Indexed keywords

COPPER ALLOYS; COPPER METALLOGRAPHY; ELASTIC SCATTERING; GOLD ALLOYS; GOLD METALLOGRAPHY; PALLADIUM ALLOYS; PHOTOELECTRONS; PHOTONS; SILVER ALLOYS; SILVER METALLOGRAPHY; SPECTROMETERS; TERNARY ALLOYS; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 77949888581     PISSN: 09106340     EISSN: 13482246     Source Type: Journal    
DOI: 10.2116/analsci.26.155     Document Type: Review
Times cited : (16)

References (38)
  • 15
    • 0004225279 scopus 로고    scopus 로고
    • Standard Reference Data Program Database 82, US Department of Commerce, National Institute of Standards and Technology, Gaithersburg, MD
    • C. J. Powell and A. Jablonski, NIST Electron Effective-Attenuation-Length Database Ver. 1.1, Standard Reference Data Program Database 82, US Department of Commerce, 2003, National Institute of Standards and Technology, Gaithersburg, MD, http://www.nist.gov/srd/nist82.htm.
    • (2003) NIST Electron Effective-Attenuation-Length Database Ver. 1.1
    • Powell, C.J.1    Jablonski, A.2
  • 28
    • 0003902695 scopus 로고    scopus 로고
    • Version 1. 1 Standard Reference Data Program Database 71, U.S. Department of Commerce, National Institute of Standards and Technology, Gaithersburg, MD
    • C. J. Powell and A. Jablonski, NIST Electron InelasticMean-Free-Path Database, Version 1.1, Standard Reference Data Program Database 71, U.S. Department of Commerce, 2000, National Institute of Standards and Technology, Gaithersburg, MD, http://www.nist.gov/srd/nist71.htm.
    • (2000) NIST Electron InelasticMean-Free-Path Database
    • Powell, C.J.1    Jablonski, A.2
  • 32
    • 77949890719 scopus 로고    scopus 로고
    • ISO 18115 Surface Chemical Analysis-Vocabulary 2001 International Organisation for Standardisation Geneva; ISO 18115 Surface Chemical Analysis-Vocabulary- Amendment 2 International Organisation for Standardisation Geneva
    • ISO 18115, Surface Chemical Analysis-Vocabulary, 2001, International Organisation for Standardisation, Geneva; ISO 18115, Surface Chemical Analysis-Vocabulary- Amendment 2, 2007, International Organisation for Standardisation, Geneva
    • (2007)
  • 36
    • 77949890540 scopus 로고    scopus 로고
    • For more information, contact A. Jablonski, Institute of Physical Chemistry, Warsaw, Poland
    • For more information, contact A. Jablonski, Institute of Physical Chemistry, Warsaw, Poland, e-mail: jablo@ichf.edu.pl.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.