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Volumn 606, Issue 5-6, 2012, Pages 644-651

Elastic photoelectron-scattering effects in quantitative X-ray photoelectron spectroscopy

Author keywords

Computer simulations; Electron solid scattering and transmission elastic; Photoelectron emission

Indexed keywords

ACCEPTANCE ANGLE; CROSS SECTION; ELECTRON-SOLID SCATTERING AND TRANSMISSION; MONTE CARLO SIMULATION; PHOTOELECTRON EMISSION; SINGLE-SCATTERING ALBEDO; X-RAY SOURCES;

EID: 84856505383     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2011.12.003     Document Type: Article
Times cited : (15)

References (32)
  • 15
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    • NIST Electron Inelastic-Mean-Free-Path Database
    • Standard Reference Data Program Database U.S. Department of Commerce, National Institute of Standards and Technology Gaithersburg, MD
    • C.J. Powell, and A. Jablonski NIST Electron Inelastic-Mean-Free-Path Database Version 1.2 Standard Reference Data Program Database 71 2010 U.S. Department of Commerce, National Institute of Standards and Technology Gaithersburg, MD http://www.nist.gov/srd/nist71.cfm
    • (2010) Version 1.2 , vol.71
    • Powell, C.J.1    Jablonski, A.2
  • 16
    • 0003998388 scopus 로고    scopus 로고
    • 88th edition CRC Press Boca Raton, FL
    • D.R. Lide RC Handbook of Chemistry and Physics 88th edition 2008 CRC Press Boca Raton, FL 10 231 http://www.jlab.org/~gwyn/ebindene.html
    • (2008) RC Handbook of Chemistry and Physics , pp. 10-231
    • Lide, D.R.1
  • 18
    • 0004124599 scopus 로고    scopus 로고
    • NIST Electron Elastic-Scattering Cross-Section Database
    • Standard Reference Data Program Database U.S. Department of Commerce, National Institute of Standards and Technology Gaithersburg, MD
    • A. Jablonski, F. Salvat, and C.J. Powell NIST Electron Elastic-Scattering Cross-Section Database Version 3.2 Standard Reference Data Program Database 64 2010 U.S. Department of Commerce, National Institute of Standards and Technology Gaithersburg, MD http://www.nist.gov/srd/nist64.cfm
    • (2010) Version 3.2 , vol.64
    • Jablonski, A.1    Salvat, F.2    Powell, C.J.3
  • 27
    • 10644271127 scopus 로고    scopus 로고
    • NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA)
    • National Institute of Standards and Technology Gaithersburg, MD
    • W.S.M. Werner, W. Smekal, and C.J. Powell NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) Version 1.3, Standard Reference Program Database 100, U.S. Department of Commerce 2011 National Institute of Standards and Technology Gaithersburg, MD http://www.nist.gov/srd/nist100.cfm
    • (2011) Version 1.3, Standard Reference Program Database 100, U.S. Department of Commerce
    • Werner, W.S.M.1    Smekal, W.2    Powell, C.J.3
  • 32
    • 0004225279 scopus 로고    scopus 로고
    • NIST Electron Effective-Attenuation-Length Database
    • Standard Reference Data Program Database U.S. Department of Commerce, National Institute of Standards and Technology Gaithersburg, MD
    • C.J. Powell, and A. Jablonski NIST Electron Effective-Attenuation-Length Database Version 1.3 Standard Reference Data Program Database 82 2011 U.S. Department of Commerce, National Institute of Standards and Technology Gaithersburg, MD http://www.nist.gov/srd/nist82.cfm
    • (2011) Version 1.3 , vol.82
    • Powell, C.J.1    Jablonski, A.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.