The SFM/ToF-SIMS combination for advanced chemically-resolved analysis at the nanoscale

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 339, Issue , 2014, Pages 85-90

  Bernard, Laetitia ^a   Heier, Jakob ^a   Paul, Wolfgang ^b   Hug, Hans J ^a,c  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^b ION TOF GmbH   (Germany)

^c UNIVERSITY OF BASEL   (Switzerland)

Author keywords

Mass spectrometry; Molecular recognition; Nanoscale materials analysis; Scanning probe microscopy; Surface characterization

Indexed keywords

MOLECULAR RECOGNITION; SCANNING PROBE MICROSCOPY;

NANO SCALE; NANO-SCALE MATERIALS; SURFACE CHARACTERIZATION;

MASS SPECTROMETRY;

EID: 84908604881     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2014.02.131     Document Type: Article

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